International Electrotechnical Commiss

International Electrotechnical Commiss

IEC 60601-1-11 Figure 1 - Small finger

IP2XC Test Probe with 50N Thrust

IP2X Test Probe with 10N Thrust

Test Probe D with 1N Force

Test Probe C with 3N Force

Test Probe B with 10N Force

Test Probe A with 50N Force

Test Probe 13 with 50N Force

Rigid Test Finger Probe with 50N Thrus

Test Probe 11 with 75N Force

Test Probe 11 with 50N Force

Test Probe B with 50N Force

Jointed Test Finger of IEC 62368 Figur

Unjointed Test Finger of IEC 62368 Fig

Articulating Finger Probe with Diamete

Test Finger Nail of BS EN 60335-1 Figu

Test Probe 43 of EN 61032

Test Probe 41 of EN 61032